News

November 2016

03 November 2016
We draw your attention to our new development: FORMULA SD Test System

The FORMULA SD Test System is a universal testing and measuring system designed for comprehensive automated verification of the static and dynamic parameters of semiconductor devices

03 November 2016
Updated line of contacting devices

Contacting devices were developed by specialists of our Company in place of earlier used third-party products

May 2016

26 May 2016
The «firmware» speed is increased on the FORMULA HF Ultra

Now initial initialization of the most highly integrated FPGAs, such as STRATIX4, f. ALTERA, can be performed on the FORMULA HF Ultra Test System via the «STAPL Player» in just 22 seconds without using the bytblaster and CAD Quartus

April 2016

28 April 2016
MetrolExpo 2016

At the 12th MetrolExpo - 2016 metrology and metrological exhibition we presented an innovative product - the Incoming inspection laboratory iLForm

March 2016

03 March 2016
Leading magazine «Sovremennaya Elektronika»

Leading magazine «Sovremennaya Elektronika» for specialists and managers of enterprises engaged in the development and production of electronic equipment, presented an article in the issue No. 3 of 2016 «On the Russian measuring device for the parameters of semiconductors - FORMULA TT2»

January 2016

27 January 2016
An article about Formula HF Ultra

For the implementation of the import substitution program in the field of VLSI, modern automated measuring instruments are required, which must possess not only advanced technical characteristics, but also comply with state metrological standards